Product Name
Vx-RF
Description
Testing capabilities that allow semiconductor manufacturers to validate full at-speed device functionality at the wafer level. Key enabler for known-good-die test models such as those required for wafer-level chip-scale packaging.
Features include:
* High-speed testing, up to 6GHz @-3dB bandwidth
* Product architecture for high particle tolerance and long lifetime
* High test cell uptime and low maintenance
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